Canadian Forest Service Publications

True-shape and defects data from mountain pine beetle-affected stems. 2007. Brdicko, J. Natural Resources Canada, Canadian Forest Service, Pacific Forestry Centre, Victoria, BC. Mountain Pine Beetle Initiative Working Paper 2007-04. 30 p.

Year: 2007

Available from: Pacific Forestry Centre

Catalog ID: 26806

Language: English

Series: Mountain Pine Beetle Working Paper (PFC - Victoria)

CFS Availability: Order paper copy (free), PDF (download)

Abstract

A sample of 233 mountain pine beetle-affected logs was collected from the log yard of Tolko Industries Ltd., sawmill in Quesnel, BC. The log sample was selected to represent the range of deterioration resulting from green, red and early grey stages of beetle attack. All logs in the sample had partially or fully developed blue stain in the sapwood. Some of the logs showed very minor checking, whereas the remainder had single and multiple checks of variable depth, some extending to the pith, and over a large part of log length. In addition, the wood grain in many of these logs was spiral, further compounding the beetle-induced damage. The majority of the logs selected were "cut-to-length". A few full-length stems were included and bucked into 10-foot logs that were individually identified so that images of the original stems, complete with defects, could be reassembled. Forintek's blue-stain and check-detection system was installed on the large-log processing line of Tolko's Quesnel sawmill, and interfaced with the mill's existing true shape-scanning system. The two systems were used together to collect true shape and mountain pine beetle-induced defect data from the sample logs. The true shape and beetle defect data were transposed into a format suitable for Optitek®, Forintek's sawmill modelling program. In addition, measurements of beetle-induced defects were collected for five logs bucked from one beetle-killed tree using Forintek's CT scanner and Forintek's laser scanning and blue-stain and check-defect detection systems. These two sets of measurements were used to compare, and highlight, the relative capabilities of these two different technologies.

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